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Product Details
  • Vacuum test fixture with parallel lifting vacuum cassette
  • Incl. fixture interface for Keysight-Testsystem i3070
  • Incl. Alum-A transport handles
  • Robust, maintenance-friendly design with outstanding service life
  • Increased ease of use thanks to simple, intuitive handling
  • For the assembly of items delivered unassembled, Refer to the drawings of the items specified in the parts list to assemble items

Other products in this series:

Technical data
  • Product group: Vacuum test fixture (VA)
  • Series: VA 3070S
  • Min. temperature: 10 °C [50 °F]
  • Max. temperature: 60 °C [140 °F]
  • RoHS-compliant: Yes
  • Max. internal interface blocks: no name
  • Test fixture type: Small stand-alone fixture, additional contacting unit, Keysight
  • Size: xx70S
  • Subseries: VA 30xx
  • Approx. parallel contact stroke: 12 mm [.472 in]
  • Interface blocks required: No
  • Max. contact force: 13,000 N [46,760 ozf]
  • Weight: 32 kg [70.5 lbs]
  • Max. interface signals: 3552
  • Main series: VA xxxx
  • Low voltage: No
  • Contact stroke generation: Vacuum
  • Max. interface signals: no name
  • Contacting direction: ICT/FCT bottom, top
  • ESD-compliant: No
  • Test system interface: Keysight i3070, small
  • Housing type: Flat housing
  • Test probe installation height, dual-stage, top: 21.5 mm [.846 in]
  • Radio frequency version: No
  • Free space above PCB: 10 mm [.393 in]
  • Rigid pin version: No
  • Additional contacting unit (ZSK), top: Yes
  • Test probe installation height, bottom: 16 mm [.629 in]
  • Pushrod length: 15 mm [.59 in]
  • Useable area, additional contact unit (WxD): 260 x 300 mm [10.2 x 11.8 in]
  • ESD version: No
  • Outer dimensions, closed (WxDxH): 631 x 534 x 209 mm [24.8 x 21 x 8.22 in]
  • Standard version: Yes
  • Test probe installation height, dual-stage, bottom: 21.5 mm [.846 in]
  • Test probe installation height, top: 16 mm [.629 in]
  • Dual-stage version: Yes
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